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CIM 2017

On 19-21 September, 18th International Metrology Congress took place in Paris. This event accompanied another well-known exhibition in France: ENOVA PARIS which associates manufacturers and distributors of electronics, metrological equipment, software and other modern solutions for optics and photonics.
RADWAG participated in this event as an exhibitor. We presented SM-MYA-5 susceptometer and UMA 5 - an automatic mass comparator equipped with 36 magazine positions. The mass comparator was selected to the competition for the most innovative instrument presented on ENOVA PARIS exhibition.
Our stand attracted the attention of congress participants and the visitors.
Our poster session during which we presented our research work: 'Optimization of Mass Standards and Weights Calibration using Automatic Mass Comparators' also attracted a lot of interest.
We would like to thank everyone who visited our stand for their time and attention. We hope to see you in 2 years during 19th International Metrology Congress.


Radwag Balances and Scales

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